Conference paper
Investigations of silicon nano-crystal floating gate memories
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
The melting transition of Xe monolayers adsorbed on a single-crystal exfoliated graphite substrate has been studied by high-resolution synchrotron x-ray scattering. At temperatures slightly above the melting transition the fluid phase has a high degree of orientational order. The results are discussed in the context of current theories of two-dimensional melting including the effects of the substrate. © 1985 The American Physical Society.
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999
P. Martensson, R.M. Feenstra
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Ellen J. Yoffa, David Adler
Physical Review B