V.M. Hallmark, S. Chiang, et al.
Physical Review Letters
The refractive indices of thin dielectric films on the surface of an optical waveguide were determined from the mode patterns, i.e., effective indices in the guide as a function of selected visible laser wavelengths. These more accurate results are compared with previous measurements and illustrate the advantages of this method. © 1978.
V.M. Hallmark, S. Chiang, et al.
Physical Review Letters
J.D. Swalen, G.C. Bjorklund, et al.
Optical and Optoelectronic Applied Science and Engineering 1990
J.D. Swalen
Thin Solid Films
Ralph H. Page, M. Jurich, et al.
Journal of the Optical Society of America B: Optical Physics