The DX centre
T.N. Morgan
Semiconductor Science and Technology
We propose and demonstrate the use of underdamped, one-dimensional parallel arrays of Josephson junctions as a tool for circuit diagnostics. By measuring the Fiske modes and the critical current in a magnetic field, we determined the self and nearest neighbor inductances as well as the capacitances of single junctions. We have used this technique to find the capacitance of Nb-Al2Ox-Nb junctions for critical current densities of 0.3-20 kA/cm2. We find that the specific capacitance increases by about a factor of 2 over this range. This increase has important consequences for the design of single-flux-quantum circuits and SQUID's. Measurement of the junction capacitance for critical current densities of 100 kA/cm2 is possible, but requires submicron junctions with dimensions of the order of 0.3 µm. © 1995 IEEE
T.N. Morgan
Semiconductor Science and Technology
Mark W. Dowley
Solid State Communications
Thomas H. Baum, Carl E. Larson, et al.
Journal of Organometallic Chemistry
R. Ghez, J.S. Lew
Journal of Crystal Growth