PaperSelection of solutes for improving electromigration resistance of metals: A new insightM.B. Small, D.A. SmithApplied Physics Letters
PaperAlternative length scales for polycrystalline materials-II. cluster morphologyC.S. Nichols, R.F. Cook, et al.Acta Metallurgica Et Materialia
PaperA technique for comparing the bulk and surface structure of defects in thin films using the scanning transmission electron microscope.M.M.J. Treacy, W. Krakow, et al.Applied Physics Letters
