Conference paper
Modeling polarization for Hyper-NA lithography tools and masks
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
A finite test set for an integer optimization problem enables us to verify whether a feasible point attains the global optimum. In this paper, we establish several general results that apply to integer optimization problems with nonlinear objective functions. © 2008 Elsevier B.V. All rights reserved.
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
F. Odeh, I. Tadjbakhsh
Archive for Rational Mechanics and Analysis
Salvatore Certo, Anh Pham, et al.
Quantum Machine Intelligence
Donald Samuels, Ian Stobert
SPIE Photomask Technology + EUV Lithography 2007