Frank R. Libsch, S.C. Lien
IBM J. Res. Dev
No abstract available.
Frank R. Libsch, S.C. Lien
IBM J. Res. Dev
Donald Samuels, Ian Stobert
SPIE Photomask Technology + EUV Lithography 2007
Heinz Koeppl, Marc Hafner, et al.
BMC Bioinformatics
Fan Zhang, Junwei Cao, et al.
IEEE TETC