PaperOn boundary conditions in lattice Boltzmann methodsShiyi Chen, Daniel Martínez, et al.Physics of Fluids
PaperThe Etching of Crystallographically Determined Orifices in SapphireA. Reisman, M. Berkenblit, et al.JES
PaperHigh speed silicon lateral trench detector on SOI substrateMin Yang, Jeremy Schaub, et al.Technical Digest-International Electron Devices Meeting
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