Lawrence Suchow, Norman R. Stemple
JES
A practical multiport measurement method is presented for the precise characterization of an N-port device using a two-port vector network analyzer. Because the N - 2 unused ports need not be terminated with matched loads, a test fixture can be simplified. Any influence of the reflections from the unterminated ports can be deembedded by port renormalization. The proposed method was verified with a coupled microstrip line structure. © 2007 IEEE.
Lawrence Suchow, Norman R. Stemple
JES
Xikun Hu, Wenlin Liu, et al.
IEEE J-STARS
R.J. Gambino, N.R. Stemple, et al.
Journal of Physics and Chemistry of Solids
Ming L. Yu
Physical Review B