Conference paperInvestigation of phase change memory confined cell endurance using transmission electron microscopy (TEM)Yu Zhu, Sangbum Kim, et al.ISTFA 2016
Conference paperComprehensive Scaling Study on 3D Cross-Point PCM toward 1Znm Node for SCM ApplicationsW. Chien, H. Ho, et al.VLSI Technology 2019
Conference paperConfined PCM-based Analog Synaptic Devices offering Low Resistance-drift and 1000 Programmable States for Deep LearningWanki Kim, Robert L. Bruce, et al.VLSI Technology 2019
Conference paperA no-verification Multi-Level-Cell (MLC) operation in Cross-Point OTS-PCMNanbo Gong, W. Chien, et al.VLSI Technology 2020