Conference paper
Scattering of transient radiation by three-dimensional objects
W. Robertson, G.V. Kopcsay, et al.
IEE/LEOS Summer Topical Meetings 1991
Measurement of the broadband (15–150 GHz) microwave dielectric properties of free-standing films is demonstrated using the technique of coherent microwave transient spectroscopy. The accuracy of the method is verified by experiments on a fused silica sheet whose dielectric properties are well known. Results of measurements on (~200 µm thick) polymer films are presented. © 1992, The Institution of Electrical Engineers. All rights reserved.
W. Robertson, G.V. Kopcsay, et al.
IEE/LEOS Summer Topical Meetings 1991
G. Arjavalingam, Yvon Pastol, et al.
IEEE T-MTT
Vincent A. Ranieri, Alina Deutsch, et al.
IEEE Trans. Instrum. Meas.
G. Arjavalingam, Y. Pastol, et al.
Proceedings of SPIE 1989