G. Arjavalingam, Y. Pastol, et al.
Proceedings of SPIE 1989
Measurement of the broadband (15–150 GHz) microwave dielectric properties of free-standing films is demonstrated using the technique of coherent microwave transient spectroscopy. The accuracy of the method is verified by experiments on a fused silica sheet whose dielectric properties are well known. Results of measurements on (~200 µm thick) polymer films are presented. © 1992, The Institution of Electrical Engineers. All rights reserved.
G. Arjavalingam, Y. Pastol, et al.
Proceedings of SPIE 1989
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IEEE Topical Meeting EPEPS 1993
J.-M. Halbout, G. Arjavalingam, et al.
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W. Robertson, G. Arjavalingam, et al.
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