Characterization of a next generation step-and-scan system
Timothy J. Wiltshire, Joseph P. Kirk, et al.
SPIE Advanced Lithography 1998
Ergodic properties of rational maps are studied, generalising the work of F. Ledrappier. A new construction allows for simpler proofs of stronger results. Very general conformal measures are considered. Equivalent conditions are given for an ergodic invariant probability measure with positive Lyapunov exponent to be absolutely continuous with respect to a general conformal measure. If they hold, we can construct an induced expanding Markov map with integrable return time which generates the invariant measure. © 2012 American Mathematical Society.
Timothy J. Wiltshire, Joseph P. Kirk, et al.
SPIE Advanced Lithography 1998
L Auslander, E Feig, et al.
Advances in Applied Mathematics
David Cash, Dennis Hofheinz, et al.
Journal of Cryptology
Hang-Yip Liu, Steffen Schulze, et al.
Proceedings of SPIE - The International Society for Optical Engineering