Measurements of the effects of asymmetry in an on-chip regulated power distribution system using a dual trace josephson sampling oscilloscope

G.-P. Li, M.B. Ketchen

Advances in Semiconductors and Semiconductor Structures 1987

C.C. Tsuei, J.R. Kirtley, et al.

Science

D. Grischkowsky, R. Sprik, et al.

CLEO 1987

M.B. Ketchen, C.J. Anderson

Applied Physics Letters