M.F. Crommie, C. Lutz, et al.
Surface Science
An infrared temperature measurement system was used to measure hot spots in a magnetic head rigid disk interface. The system employed the spectral distribution as well as intensity of sampled radiation to determine both the temperature and effective area of microscopic sources at elevated temperature. Flash temperatures between particulate and thin-film rigid disks and a simulated transparent sapphire slider at various operating conditions were measured. © 1991 by ASME.
M.F. Crommie, C. Lutz, et al.
Surface Science
J.K. Gimzewski, T.A. Jung, et al.
Surface Science
S.W. Bedell, H. Chen, et al.
MRS Proceedings 2004
Jannis Born, Matteo Manica
ICLR 2022