Conference paper
Terahertz optical properties of carriers in silicon
Martin Van Exter, D. Grischkowsky
IQEC 1990
A new and extremely general interferometric technique has been experimentally demonstrated that permits the direct measurement of optical phase on a subpicosecond time scale. The intensity is characterized by cross correlation, and thus the optical field is completely determined. © 1987 Optical Society of America.
Martin Van Exter, D. Grischkowsky
IQEC 1990
Joshua E. Rothenberg, D. Grischkowsky, et al.
IQEC 1984
D. Grischkowsky, Ch. Fattinger
CLEO 1989
M.B. Ketchen, D. Grischkowsky, et al.
Applied Physics Letters Applied Physics Letters