PaperAnnealing of surface states in polycrystalline-silicon-gate capacitorsT.W. HickmottJournal of Applied Physics
PaperEnergetic electronic processes and negative resistance in amorphous TaTa2O5Au and AlAl2O3Au diodesT.W. HickmottThin Solid Films
PaperBarrier heights at the polycrystalline silicon-SiO2 interfaceT.W. Hickmott, R.D. IsaacJournal of Applied Physics
PaperEffect of bombardment by glass-forming ions on thermally stimulated ionic conductivity of sodium in SiO2T.W. HickmottPhysical Review Letters
