S.S. Cherepov, B.C. Koop, et al.
Physical Review Letters
Magnetoresistance (MR) measurement of unpatterned magnetic tunnel junction wafers was discussed. Current-in-plane tunneling was used. It was found that results are particularly useful for optimizing deposition conditions, nondestructive monitoring and also measures thermal stability.
S.S. Cherepov, B.C. Koop, et al.
Physical Review Letters
D.C. Worledge, P.L. Trouilloud, et al.
Journal of Applied Physics
B. Petek, P.L. Trouilloud, et al.
IEEE Transactions on Magnetics
B.C. Koop, Yu. I. Dzhezherya, et al.
Applied Physics Letters