Kigook Song, Robert D. Miller, et al.
Macromolecules
Long-term measurement of bias temperature instability (BTI) degradation obtained from an on-chip sensor is presented. The sensor reports measurements periodically with a digital output. Implemented on IBM's z196 enterprise systems using IBM 45 nm technology, it can be used to monitor long-term degradation under real-use conditions. Over 700 days worth of ring oscillator degradation data from customer systems is presented. The data obtained by this sensor are consistent with models based on accelerated testing.
Kigook Song, Robert D. Miller, et al.
Macromolecules
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
J. Tersoff
Applied Surface Science
Frank R. Libsch, Takatoshi Tsujimura
Active Matrix Liquid Crystal Displays Technology and Applications 1997