PaperMicrostructural changes in silicon induced by patterning with focused ion beams of Ga, Si and AuSee Wee Chee, Martin Kammler, et al.Ultramicroscopy
PaperAtomic-scale characterization of graphene p-n junctions for electron-optical applicationsXiaodong Zhou, A. Kerelsky, et al.ACS Nano
PaperElectric field induced au nanocrystal formation in aqueous solutionsJeung Hun Park, Mark C. Reuter, et al.Microscopy and Microanalysis
PaperControlling the growth of Si/Ge nanowires and heterojunctions using silver-gold alloy catalystsYi-Chia Chou, Cheng-Yen Wen, et al.ACS Nano