Conference paper
Theory for electromigration failure in Cu conductors
J.R. Lloyd, C.E. Murray, et al.
International Workshop on Stress-Induced Phenomena in Metallization 2005
J.R. Lloyd, C.E. Murray, et al.
International Workshop on Stress-Induced Phenomena in Metallization 2005
S. Zafar, V. Narayanan, et al.
VLSI Technology 2005
K.L. Saenger, K.E. Fogel, et al.
Applied Physics Letters
K. Ida, S. Nguyen, et al.
AMC 2005