IEEE Design and Test of Computers

Paper

01 Nov 2004

Jitter measurements of high-speed serial links

View publication

Abstract

Jitter is one of the most important issues in the design and operation of high-speed serial links. This article focuses on the BERT scan method, a jitter characterization method based on scanning the bit-error rate within the eye diagram. © 2004 IEEE.

Related

Conference paper

Design and implementation of an optical interconnect demonstrator with board-integrated waveguides and microlens coupling

Christoph Berger, Urs Bapst, et al.

IEE/LEOS Summer Topical Meetings 2004

Conference paper

A 40-Gb/s, digitally programmable peaking limiting amplifier with 20-dB differential Gain in 90-nm CMOS

Jonas R. M. Weiss, Martin L. Schmatz, et al.

RFIC 2006

Conference paper

When virtual meets physical at the edge: A field study on datacenters' virtual traffic

Robert Birke, Mathias Bjorkqvist, et al.

SIGMETRICS 2015

Conference paper

Scalable, efficient ASICS for the square kilometre array: From A/D conversion to central correlation

Martin L. Schmatz, Rik Jongerius, et al.

ICASSP 2014

View all publications