PaperCharge trapping related threshold voltage instabilities in high permittivity gate dielectric stacksSufi Zafar, Alessandro Callegari, et al.Journal of Applied Physics
PaperIIA-6 Sensitivity of Threshold Voltage and Sheet Carrier Concentration to Material and Electronic Parameters in a HEMT DeviceSandip TiwariIEEE T-ED
PaperEmpirical fit to band discontinuities and barrier heights in III-V alloy systemsSandip Tiwari, David J. FrankApplied Physics Letters
