B. Ricco, M.Ya. Azbel, et al.
Physical Review Letters
Optical and Hall effect measurements on thin film layers of polycrystalline IrSi1.75 show that this material is a semiconductor. The band gap is approximately 1.2 eV. The films obtained saturated with silicon were p-type with a charge carrier density of the order of 4×1017 cm -3.
B. Ricco, M.Ya. Azbel, et al.
Physical Review Letters
J. De Sousa Pires, F.M. D'Heurle, et al.
Applied Physics Letters
M.H. Brodsky, R.S. Title
Physical Review Letters
P. Chaudhari, S.R. Herd, et al.
Journal of Non-Crystalline Solids