H. Mell, M.H. Brodsky
Thin Solid Films
Optical and Hall effect measurements on thin film layers of polycrystalline IrSi1.75 show that this material is a semiconductor. The band gap is approximately 1.2 eV. The films obtained saturated with silicon were p-type with a charge carrier density of the order of 4×1017 cm -3.
H. Mell, M.H. Brodsky
Thin Solid Films
P.J. Stiles, M.H. Brodsky
Solid State Communications
K. Weiser, M.H. Brodsky, et al.
Journal of Non-Crystalline Solids
G. Lucovsky, M.H. Brodsky, et al.
Physical Review B