M.H. Brodsky
Thin Solid Films
Optical and Hall effect measurements on thin film layers of polycrystalline IrSi1.75 show that this material is a semiconductor. The band gap is approximately 1.2 eV. The films obtained saturated with silicon were p-type with a charge carrier density of the order of 4×1017 cm -3.
M.H. Brodsky
Thin Solid Films
I. Solomon, M.H. Brodsky
Journal of Applied Physics
M.H. Brodsky, Manuel Cardona, et al.
Physical Review B
S.R. Herd, P. Chaudhari, et al.
Journal of Non-Crystalline Solids