Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
We show that base-stock levels first increase and then decrease as the standard deviation increases for a variety of non-negative random variables with a given mean and provide a distribution-free upper bound for optimal base-stock levels that grows linearly with the standard deviation and then remains constant. © 2007.
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
John R. Kender, Rick Kjeldsen
IEEE Transactions on Pattern Analysis and Machine Intelligence
Charles Micchelli
Journal of Approximation Theory
Jaione Tirapu Azpiroz, Alan E. Rosenbluth, et al.
SPIE Photomask Technology + EUV Lithography 2009