P. Alnot, D.J. Auerbach, et al.
Surface Science
We report on the interfacial intermixing of ultrathin Co films on a Cu(001) single crystal, two materials that are immiscible in the bulk. With increasing deposition rate we find a crossover from layer-by-layer to bilayer growth due to a hindered diffusion from the first layer to the substrate. Above two monolayers, growth proceeds in a layer-by-layer fashion. These effects are explained in terms of surface free energies. © 1997 Elsevier Science B.V.
P. Alnot, D.J. Auerbach, et al.
Surface Science
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SPIE Advanced Lithography 2008