Conference paper
Modeling polarization for Hyper-NA lithography tools and masks
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
The interlayer penetration depth in layered superconductors may be determined from scanning Superconducting QUantum Interference Device (SQUID) microscope images of interlayer Josephson vortices. We compare our findings at 4 K for single crystals of the organic superconductor κ-(BEDT-TTF)2Cu(NCS)2 and three near-optimally doped cuprate superconductors: La2-xSrxCuO4, (Hg,Cu)Ba2CuO4+δ, and Tl2Ba2CuO6+δ. © 2000 Elsevier Science B.V. All rights reserved.
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
H.D. Dulman, R.H. Pantell, et al.
Physical Review B
Ronald Troutman
Synthetic Metals
Q.R. Huang, Ho-Cheol Kim, et al.
Macromolecules