PaperRemote Coulomb scattering in metal-oxide-semiconductor field effect transistors: Screening by electrons in the gateF. Gámiz, M.V. FischettiApplied Physics Letters
Conference paperPower measurements of adiabatic circuits by thermoelectric techniqueP. Solomon, D.J. FrankLPE 1995
Conference paperComparison of high speed voltage-scaled conventional and adiabatic circuitsD.J. FrankLPED 1996
PaperScaling MOSFETs to 10 nm: Coulomb effects, source starvation, and virtual source modelM.V. Fischetti, S. Jin, et al.Journal of Computational Electronics
