Robert E. Donovan
INTERSPEECH - Eurospeech 2001
This historical review covers IBM experiments in evaluating radiation-induced soft fails in LSI electronics over a fifteen-year period, concentrating on major scientific and technical advances which have not been previously published.
Robert E. Donovan
INTERSPEECH - Eurospeech 2001
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Nanda Kambhatla
ACL 2004
S.F. Fan, W.B. Yun, et al.
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