Thomas M. Cheng
IT Professional
Paper
IBM experiments in soft fails in computer electronics (1978-1994)
Abstract
This historical review covers IBM experiments in evaluating radiation-induced soft fails in LSI electronics over a fifteen-year period, concentrating on major scientific and technical advances which have not been previously published.
Related
Frank R. Libsch, S.C. Lien
IBM J. Res. Dev
S.M. Sadjadi, S. Chen, et al.
TAPIA 2009
Yao Qi, Raja Das, et al.
ISSTA 2009