Paper
The DX centre
T.N. Morgan
Semiconductor Science and Technology
We integrated an optical magnetometer into a conventional Kerr microscope, which gives us the possibility to measure hysteresis loops and observe magnetic domains simultaneously. An application is shown, the investigation of an exchange coupled Ni81Fe19/Ru/Ni81Fe19 sample in which the top ferromagnetic layer is wedge shaped. © 1995.
T.N. Morgan
Semiconductor Science and Technology
J. Paraszczak, J.M. Shaw, et al.
Micro and Nano Engineering
K.N. Tu
Materials Science and Engineering: A
Kenneth R. Carter, Robert D. Miller, et al.
Macromolecules