PaperResolution enhancement by deconvolution using a field emission source in electron energy loss spectroscopyP.E. Batson, D.W. Johnson, et al.Ultramicroscopy
PaperEffects of reactive ion etching on chemical vapor depositionC.Y. Wong, P.E. BatsonApplied Physics Letters
PaperProspects for high-resolution electron energy-loss experiments with the scanning transmission electron microscopeP.E. BatsonUltramicroscopy
