L. Esaki, L.L. Chang
Proceedings of the IEEE
Tunnel junctions are fabricated by evaporating GeTe on GaAs substrates. The current-voltage characteristics are similar to those in a Schottky barrier, except for the existence of a negative-resistance region. A simple model which predicts such behavior is analyzed to interpret the experimental results. © 1969 The American Institute of Physics.
L. Esaki, L.L. Chang
Proceedings of the IEEE
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Applied Physics Letters
L.L. Chang, L. Esaki, et al.
Applied Physics Letters
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Physical Review Letters