J.G. Deak, A.H. Miklich, et al.
Applied Physics Letters
In this letter we determine the theoretical limit of the magnetic-field sensitivity of the flux-gate magnetometer. In order to do so, we have developed a model for the white noise of a flux gate based on the fundamental dynamics of the magnetic material forming the flux-gate core. Solving this model, we predict that the white noise of a physically realizable flux gate with a volume of 2 X 10-8 m3 is less than 100 fT/√HZ. The white noise varies with the lossy susceptibility of the core and inversely with the volume. We also compare the measured white noise of a thin-film flux gate with the predictions of our model and find that the measured and predicted noise agree reasonably well. © 1999 American Institute of Physics.
J.G. Deak, A.H. Miklich, et al.
Applied Physics Letters
R.H. Koch, V. Foglietti, et al.
Applied Physics Letters
Daniel Loss, David P. DiVincenzo, et al.
Physical Review Letters
T. Bohr, G. Grinstein, et al.
Physical Review A