J. Paraszczak, J.M. Shaw, et al.
Micro and Nano Engineering
We have studied the fractional quantization of the Hall resistance at 0.51 K in two-dimensional hole systems formed at p+ interfaces with mobilities as high as 8.0 × 104 cm2/Vs at 4 K. In addition to the Hall quantization for a fractional filling factor =23, we report for the first time the observation of an almost fully developed Hall plateau at =35 and the existence of weak but distinct structure in the magnetoresistance for =37 and 65. Similarly, magnetoresistance minima occurred at =53, 43, 23, 35, and 25. In contrast with two-dimensional electron systems, conspicuously absent was any magnetoresistance feature in the vicinity of =45. © 1984 The American Physical Society.
J. Paraszczak, J.M. Shaw, et al.
Micro and Nano Engineering
J.A. Barker, D. Henderson, et al.
Molecular Physics
Douglass S. Kalika, David W. Giles, et al.
Journal of Rheology
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering