Conference paperComputational and Monte-Carlo aspects of systems for monitoring reliability dataEmmanuel YashchinCOMPSTAT 2010
PaperPerformance of cusum control schemes for serially correlated observationsEmmanuel YashchinTechnometrics
PaperThreshold electromigration failure time and its statistics for Cu interconnectsBaozhen Li, Cathryn Christiansen, et al.Journal of Applied Physics
PaperDiscussion of recent advances in process monitoring: Nonparametric and variable-selection methods for phase i and phase IIEmmanuel YashchinQuality Engineering