Gregory Czap, Kyungju Noh, et al.
APS Global Physics Summit 2025
We present a comprehensive theoretical approach to determine concentrations of dopant impurities in semiconductors. The formalism is applied to the problem of acceptor doping in ZnSe. Formation energies and concentrations of impurities and native defects are expressed as a function of chemical potentials, for which experimentally accessible ranges are calculated. We show that limitations in the achievable hole concentrations can be explained by two mechanisms: one is the competition between various substitutional and interstitial configurations (compensation), the other is the solubility limit imposed by formation of other phases. Nitrogen is most promising among the dopants examined. © 1993 The American Physical Society.
Gregory Czap, Kyungju Noh, et al.
APS Global Physics Summit 2025
Mitsuru Ueda, Hideharu Mori, et al.
Journal of Polymer Science Part A: Polymer Chemistry
J.H. Kaufman, Owen R. Melroy, et al.
Synthetic Metals
J. Paraszczak, J.M. Shaw, et al.
Micro and Nano Engineering