Field desorption of a Si atom from a metal surface

N.D. Lang

doi:10.1016/0038-1098(92)90315-Z

Solid State Communications

Paper

01 Jan 1992

Field desorption of a Si atom from a metal surface

View publication

Abstract

The field desorption of a Si atom from a metal surface is studied by performing a self-consistent density-functional calculation for the electronic structure of an adsorbed Si atom with and without an applied electric field. © 1992.

Conference paper

Coupling analysis of through-silicon via (TSV) arrays in silicon interposers for 3D systems

Biancun Xie, Madhavan Swaminathan, et al.

EMC 2011

Paper

On Fitting Error Functions to Data

R. Ghez, M.B. Small

JES

Conference paper

Compression for data archiving and backup revisited

Corneliu Constantinescu

SPIE Optical Engineering + Applications 2009

Paper

Scanning tunneling microscopy and spectroscopy of thin metal films on the GaAs(110) surface

P. Martensson, R.M. Feenstra

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

View all publications

Abstract

Related

Coupling analysis of through-silicon via (TSV) arrays in silicon interposers for 3D systems

On Fitting Error Functions to Data

Compression for data archiving and backup revisited

Scanning tunneling microscopy and spectroscopy of thin metal films on the GaAs(110) surface