PaperA new two-dimensional particle detector for a toroidal electrostatic analyzerR.M. Tromp, M. Copel, et al.Review of Scientific Instruments
PaperLow energy electron microscopy studies of Ge and Ag growth on Si(111)A.W. Denier van der Gon, R.M. Tromp, et al.Thin Solid Films
PaperGrowth dynamics of titanium silicide nanowires observed with low-energy electron microscopyP.A. Bennett, B. Ashcroft, et al.Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
PaperEffect of the surface upon misfit dislocation velocities during the growth and annealing of SiGe/Si (001) heterostructuresE.A. Stach, R. Hull, et al.Journal of Applied Physics
