Darryl R. Freedman, Stanley E. Schuster, et al.
IEEE JSSC
Expenmental studies of connections formed in MOS-type structures by nanosecond dye laser pulses are described. Of particular importance are results relating to the reliability and reproducibility of the connection process. A model for the connection process is presented which correlates well with the various observations and experiments. Copyright © 1975 by The Institute of Electrical and Electronics Engineers, Inc.
Darryl R. Freedman, Stanley E. Schuster, et al.
IEEE JSSC
Hans M. Jacobson, Prabhakar N. Kudva, et al.
ASYNC 2002
Alper Buyuktosunoglu, David H. Albonesi, et al.
LPED 2002
Chia-Fu Hsu, Peter S. Zory, et al.
IEEE Journal on Selected Topics in Quantum Electronics