PaperEXCIMER LASER PROJECTION LITHOGRAPHY ON A FULL-FIELD SCANNING PROJECTION SYSTEM.R.T. Kerth, K. Jain, et al.IEEE Electron Device Letters
Conference paperMeasurement of polarization components using a pour detector polarimeterM.R. Latta, S.L. HeesackerProceedings of SPIE 1989
PaperUltrafast deep UV lithography using excimer lasersK. Jain, S. Rice, et al.Polymer Engineering & Science