PaperAmorphous Cr 5Si 3 thin films- morphology and kinetics of crystallizationB.Z. Weiss, K.N. Tu, et al.Metallurgical Transactions A
PaperStress-induced absorption and emission of point defects by grain boundariesA.H. King, D.A. SmithMetal Science
Paperlow Temperature Silicon Epitaxy by Hot Wall Ultrahigh Vacuum/Low Pressure Chemical Vapor Deposition Techniques: Surface OptimizationB.S. Meyerson, E. Ganin, et al.JES
PaperEffect of temperature on electrical and microstructural changes of coevaporated Ir-Si alloy filmsB.Z. Weiss, K.N. Tu, et al.Journal of Applied Physics
