Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
Epitaxial Dy2 O3 thin films are grown on SrTiO 3 (001) substrates by molecular beam epitaxy. Structural, morphological, and interfacial properties of the Dy2 O3 film are investigated by in situ reflection high-energy electron diffraction (RHEED), ex situ x-ray diffraction (XRD), atomic force microscopy, and cross-sectional transmission electron microscopy (TEM). RHEED patterns and XRD spectra show that the Dy2 O3 film is grown epitaxially in a cubic phase with a (001) orientation. The surface of the film is smooth with a rms roughness of 4 Å. The TEM image shows that the Dy2 O 3 film is crystalline with an abrupt interface between the film and substrate without any indication of a chemical reaction or interdiffusion occurring at the interface. © 2011 American Vacuum Society.
Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
Imran Nasim, Melanie Weber
SCML 2024
David B. Mitzi
Journal of Materials Chemistry
William G. Van der Sluys, Alfred P. Sattelberger, et al.
Polyhedron