J.A. Van Vechten, J.M. Blum, et al.
IEEE T-ED
The influence of the active layer dopant on the degradation of GaAsSingle Bond signAlx Ga1-xAs double-heterostructure lasers has been studied using pulsed excitation. Compensated p -type dopants give the slowest degradation, while n -type dopants give the most rapid. These results can be understood on the basis of arsenic vacancy migration and the formation of arsenic vacancy-acceptor complexes. © 1974 American Institute of Physics.
J.A. Van Vechten, J.M. Blum, et al.
IEEE T-ED
K.K. Shih, G.D. Pettit, et al.
Journal of Applied Physics
K.K. Shih, J.M. Blum
Solid-State Electronics
M.B. Small, A.E. Blakeslee, et al.
Journal of Crystal Growth