Shiyi Chen, Yuefan Deng, et al.
Physics Letters, Section A: General, Atomic and Solid State Physics
We analyze the effect of interface curvature and stress on reaction rates at solid-solid or solid-fluid interfaces. Curvature affects the forward and reverse reactions differently, and cannot be related simply to an interface energy. To describe the effect of stress requires at least two parameters each for forward and reverse reactions. The distribution of local configurations may be ignored to linear order; but beyond the linear regime, this effect can cause large deviations from the expected exponential dependence. © 1998 American Institute of Physics.
Shiyi Chen, Yuefan Deng, et al.
Physics Letters, Section A: General, Atomic and Solid State Physics
Yuhai Tu, J. Tersoff
Physical Review Letters
Qiwei Yu, Yuhai Tu
Physical Review E
J. Tersoff, P.C. Kelires
Symposium on Process Physics and Modeling in Semiconductor Technology 1990