Thomas E. Karis, C. Mark Seymour, et al.
Rheologica Acta
Low temperature diffusion of Cr and Si through thin gold films is studied in N2 and in (N2 + CO) ambients. The out-diffusion of both Cr and Si to the gold surface is suppressed in the presence of CO. The results are discussed in terms of a model which considers the roles of both the gold film and the ambients used. © 1980, The Electrochemical Society, Inc. All rights reserved.
Thomas E. Karis, C. Mark Seymour, et al.
Rheologica Acta
E. Burstein
Ferroelectrics
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SPIE Advanced Lithography 2007
S. Cohen, T.O. Sedgwick, et al.
MRS Proceedings 1983