Current challenges in Ge MOS technology
A. Dimoulas, M. Houssa, et al.
ECS Meeting 2006
X-ray microscopy using magnetic linear dichroism of a zero-field-grown multidomain Co/LaFeO 3 ferromagnet/antiferromagnet sample shows a local exchange bias of random direction and magnitude. A statistical analysis of the local bias of individual micron-size magnetic domains demonstrates an increasing bias field with decreasing domain size as expected for a random distribution of pinned, uncompensated spins, which are believed to mediate the interface coupling. A linear dependence with the inverse domain diameter is found. © 2004 American Institute of Physics.
A. Dimoulas, M. Houssa, et al.
ECS Meeting 2006
S. Gariglio, J.W. Seo, et al.
Physical Review B - CMMP
J.W. Seo, Ch. Dieker, et al.
Applied Physics Letters
A. Scholl, F. Nolting, et al.
Journal of Applied Physics