PaperGraded electronic structure in a 3 nm strained Ge40Si60 quantum wellP.E. Batson, J.F. MorarPhysical Review Letters
PaperThin-oxide dual-electron-injector annealing studies using conductivity and electron energy-loss spectroscopyL. Dori, J. Bruley, et al.Journal of Applied Physics
PaperApplication of electron and ion beam analysis techniques to microelectronicsT.S. Kuan, P.E. Batson, et al.IBM J. Res. Dev
PaperStructural studies on small areas using stemP.E. Batson, J.M. Gibson, et al.Journal of Non-Crystalline Solids
