Marshall I. Nathan, John E. Smith Jr., et al.
Journal of Applied Physics
Diffusion of Ag110m radioactive tracer has been measured in amorphous Pd-19-at.%-Si specimens characterized by a Seeman-Bohlin x-ray diffractometer. The diffusion parameters in this metallic amorphous phase have been found to have a regime distinctly different from liquid and crystalline phases. © 1975 The American Physical Society.
Marshall I. Nathan, John E. Smith Jr., et al.
Journal of Applied Physics
L.T. Shi, K.N. Tu
Applied Physics Letters
R.C. Cammarata, C.V. Thompson, et al.
Applied Physics Letters
K.N. Tu
Journal of Applied Physics