Conference paper
Investigations of silicon nano-crystal floating gate memories
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
Dhdelectric characteristics were determined for a microstructurally anisotropic borosilicate glass prepared by uniaxiallhd stretching phase‐separated glass rods. The specimen showed a dielectric loss peak caused by the inhomogeneous microstructure; its magnitude varied with the orientation of the specimen with respect to the electric field direction. The results are in agreement with Sillars’ theory. Copyright © 1981, Wiley Blackwell. All rights reserved
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
Kigook Song, Robert D. Miller, et al.
Macromolecules
A. Krol, C.J. Sher, et al.
Surface Science
A.B. McLean, R.H. Williams
Journal of Physics C: Solid State Physics