LOW TEMPERATURE GROWTH OF Al//xGa//1// minus //xAs BY MOCVD.
T.F. Kuech, E. Veuhoff, et al.
Gallium Arsenide and Related Compounds 1984
We have employed photoluminescence spectroscopy to determine the temperature dependence of the interdiffusion coefficient of Al and Ga in GaAs/Al0.3Ga0.7As quantum wells. The position of the photoluminescence peaks, due to the n=1 electron to heavy-hole transition, was measured before and after annealing the samples. A variational calculation was employed to determine the expected position of these photoluminescence peaks and from this a value of the interdiffusion coefficient was extracted. The interdiffusion process is characterized by an activation energy of about 6 eV leading to an interdiffusion coefficient at 850°C of 4×10 -19 cm2/s. This technique allows for the measurement of small diffusion coefficients in a wide variety of material systems.
T.F. Kuech, E. Veuhoff, et al.
Gallium Arsenide and Related Compounds 1984
T.F. Kuech, R.M. Potemski, et al.
Journal of Electronic Materials
T.F. Kuech, R.M. Potemski, et al.
Journal of Crystal Growth
G.D. Gilliland, D.J. Wolford, et al.
Gallium Arsenide and Related Compounds 1991