Frank R. Libsch, S.C. Lien
IBM J. Res. Dev
MRAM (magnetic random access memory) technology, based on the use of magnetic tunnel junctions (MTJs) as memory elements, is a potentially fast nonvolatile memory technology with very high write endurance. This paper is an overview of MRAM design considerations. Topics covered include MRAM fundamentals, array architecture, several associated design studies, and scaling challenges. In addition, a 16-Mb MRAM demonstration vehicle is described, and performance results are presented. ©Copyright 2006 by International Business Machines Corporation.
Frank R. Libsch, S.C. Lien
IBM J. Res. Dev
Rajeev Gupta, Shourya Roy, et al.
ICAC 2006
Preeti Malakar, Thomas George, et al.
SC 2012
Arun Viswanathan, Nancy Feldman, et al.
IEEE Communications Magazine