S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999
The use of a dedicated chamber to perform pre-epi deposition cleaning allows native oxide removal with a low thermal budget, and significantly improves throughput of low-temperature Si and SiGe applications. Wafers processed in the cleaning chamber show no detectable contaminants, and the cleansed surface is actually significantly smoother because of cleaning down to a sub-angstrom level.
S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999
Q.R. Huang, Ho-Cheol Kim, et al.
Macromolecules
C.M. Brown, L. Cristofolini, et al.
Chemistry of Materials
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EMC 2001